Development of Mathematical Models for Detecting Micron Scale Volumetric Defects in Thin Film Coatings
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Gaigals, G., M. Donerblics, and G. Dreifogels. "Development of Mathematical Models for Detecting Micron Scale Volumetric Defects in Thin Film Coatings." Latvian Journal of Physics and Technical Sciences 53.2, 38-47, 2016.
